Skip to Content
G&H company logo featuring a stylized blue geometric diamond shape to the left of bold blue letters “G&H” on a white background.

AODF 4065 Deflector

A TeO₂ dual-wavelength AO deflector designed for visible red and near-infrared beam control at 635nm and 1550nm suited to precision laser systems requiring controlled optical deflection & defined beam separation.

Full Product Description
Stock Code:
97-03438-02
Minimum Wavelength (nm):
635
Maximum Wavelength (nm):
1550
Center Frequency (MHz):
65
RF Bandwidth (MHz):
90.9 @ 635nm 40 @1550nm

Need a product customized?

We can customize our products to fit your requirements.

Find out more

Product description

The G&H AODF 4065 TeO₂ 635nm & 1550nm Acousto-Optic Deflector is designed for beam control applications requiring operation at both visible red and near-infrared wavelengths. It uses TeO₂ as the acousto-optic medium and is specified with polarization perpendicular to the mounting plane.

The device provides a 3 mm x 1.5 mm active aperture and is specified with a 50 Ohms nominal input impedance. Performance is defined at 635nm and 1550nm, with operating frequency, RF power, diffraction efficiency, beam separation and rise time values specified separately for each wavelength.

The AODF 4065 supports beam control in optical systems where dual-wavelength operation, collinearity, contrast and defined diffraction performance are important. It is suitable for specialist photonics platforms, optical instrumentation and OEM laser systems using visible red and near-infrared sources.

Key features

  • Supports dual-wavelength beam control at visible red and near-infrared wavelengths
  • TeO₂ acousto-optic medium supports efficient laser beam deflection
  • Defined wavelength-specific performance supports predictable system integration
  • High contrast ratio supports applications requiring strong optical on/off performance
  • Specified beam collinearity supports alignment-sensitive optical systems
  • Compact active aperture supports integration into defined beam paths
  • Anti-reflection coated optical surfaces support reduced surface reflection
  • Defined beam separation supports controlled optical path design
  • Suitable for OEM photonics systems using both 635nm and 1550nm sources
  • Designed for applications where wavelength flexibility, RF performance and beam control are important

Specifications

NameValue
Stock Code97-03438-02
ModelAODF 4065
Spectral RegionRed-Near IR
Minimum Wavelength (nm)635
Maximum Wavelength (nm)1550
Center Frequency (MHz)65
RF Bandwidth (MHz)90.9 @ 635nm 40 @1550nm
Active Aperture Height (mm)1.5
Active Aperture Length (mm)3
Polarization (relative to base)Vertical
Optical MaterialTeO₂
Acoustic Velocity (mm/μs)0.66
RF Power (W)0.7
Recommended RF Driver6000 Series Driver

(Values for Guidance Only - refer to datasheet where available)

Specifications

Performance vs wavelength

Wavelength635 nm1555 nm
Operational RF power0.1 W0.7 W
Bragg angle157 mr157 mr
Beam separation86.5 mr91.6 mr

Performance vs beam diameter

Beam diameter1000 μm1000 μm
Wavelength635 nm1550 nm
Diffraction efficiency65%70%
Rise time950 ns950 ns
Frequency90.9 MHz40 MHz

NOTE: All Specifications above are "Typical Performance" values for guidance only.