Skip to Content
G&H company logo featuring a stylized blue geometric diamond shape to the left of bold blue letters “G&H” on a white background.

AODF 4200-1 Deflector

A TeO₂ 442nm visible acousto-optic deflector with 200 MHz centre frequency, 100 MHz RF bandwidth, 4.8 mm active aperture and 63.1 mrad scan angle for beam steering, optical scanning and precision beam control.

Full Product Description
Stock Code:
97-01610-51
Minimum Wavelength (nm):
442
Maximum Wavelength (nm):
442
Scan Angle (mrad):
62.3
Center Frequency (MHz):
200
RF Bandwidth (MHz):
100

Need a product customized?

We can customize our products to fit your requirements.

Find out more

Product description

The G&H AODF 4200-1 TeO₂ 442nm Visible Acousto-Optic Deflector is designed for visible laser beam steering and scanning applications requiring precise acousto-optic beam control. It uses TeO₂ as the acousto-optic medium and operates in a shear, off-axis acoustic mode.

The AODF 4200-1 is specified for 442 nm operation, with input polarization at 0° to the mounting plane and output polarization at 90° to the mounting plane. Its RF configuration is centred at 200 MHz with a 100 MHz RF bandwidth, supporting controlled beam deflection across the operating range.

With its defined active aperture, high diffraction efficiency and wide scan angle, the AODF 4200-1 is suitable for visible laser systems, optical instrumentation and OEM photonics platforms requiring accurate beam steering and repeatable scanning performance.

Key features

  • Supports visible spectral region laser beam steering at 442 nm
  • Enables wide-angle optical scanning for precision beam control applications
  • TeO₂ acousto-optic medium supports efficient visible wavelength deflection
  • Suitable for OEM visible laser systems requiring controlled beam positioning
  • Defined input and output polarization supports predictable optical integration
  • Anti-reflection coated optical surfaces support efficient transmission through the device
  • Supports optical instrumentation where repeatable beam movement is required
  • Suitable for specialist photonics platforms requiring visible beam control
  • Designed for applications where scan angle, diffraction efficiency and RF performance are important
  • Supports precision laser systems requiring controlled acousto-optic deflection

Specifications

NameValue
Stock Code97-01610-51
ModelAODF 4200-1
Spectral RegionVisible
Minimum Wavelength (nm)442
Maximum Wavelength (nm)442
Scan Angle (mrad)62.3
No. of Resolvable Spots451
Center Frequency (MHz)200
RF Bandwidth (MHz)100
Active Aperture Height (mm)4.8
Active Aperture Length (mm)4.8
Polarization (relative to base)Horizontal
Optical MaterialTeO2
Acoustic Velocity (mm/μs)0.71
RF Power (W)1
Recommended RF Driver6000 Series Driver

(Values for Guidance Only - refer to datasheet where available)

  • Example AR Coating Curve (Guidance only)

    Calculated reflectance curve for a 442 nm V-coat, showing reflectance per surface from 325 nm to 500 nm. Reflectance is lowest around 390–400 nm and rises gradually towards longer wavelengths, reaching just over 2% at 500 nm.