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AODF 4140 Quartz Deflector

A crystal quartz visible green acousto-optic deflector designed for 532nm beam steering, using a 2 element phased array, apodized configuration for controlled optical deflection.

Full Product Description
Stock Code:
97-03404-02
Minimum Wavelength (nm):
532
Maximum Wavelength (nm):
532
Scan Angle (mrad):
7.9
Center Frequency (MHz):
147.5
RF Bandwidth (MHz):
85

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Product description

The G&H AODF 4140 Quartz 532nm Apodized Visible Acousto-Optic Deflector is designed for beam steering and optical scanning applications at 532nm. It uses crystal quartz as the acousto-optic medium and operates in a longitudinal acoustic mode.

The device features a 2 element phased array, apodized configuration, supporting controlled acousto-optic deflection in visible green laser systems. Both input and output polarization are specified at 90° to the mounting plane, supporting predictable optical integration.

With a 4 x 10 mm active aperture, 85 MHz RF bandwidth and water-cooled construction with Te-Cu water channels, the AODF 4140 is suitable for OEM laser systems, optical instrumentation and specialist photonics platforms requiring stable visible wavelength beam control.

Key features

  • Supports 532nm visible green laser beam steering in precision optical systems
  • Apodized phased array design supports controlled acousto-optic deflection
  • Crystal quartz AO medium supports reliable visible wavelength operation
  • Water-cooled construction supports use in active laser systems
  • Larger rectangular active aperture supports integration with defined optical beam paths
  • Defined input and output polarization supports predictable optical alignment
  • Suitable for OEM laser platforms requiring stable green beam positioning
  • Supports optical instrumentation where repeatable beam scanning is required
  • Designed for applications where diffraction efficiency and beam control are important
  • Supports specialist photonics systems requiring controlled 532nm optical deflection

Specifications

NameValue
Stock Code97-03404-02
ModelAODF 4140 Quartz
Spectral RegionVisible
Minimum Wavelength (nm)532
Maximum Wavelength (nm)532
Scan Angle (mrad)7.9
No. of Resolvable Spots99
Center Frequency (MHz)147.5
RF Bandwidth (MHz)85
Active Aperture Height (mm)4
Active Aperture Length (mm)10
Polarization (relative to base)Vertical
Optical MaterialCrystal Quartz
Acoustic Velocity (mm/μs)5.74
RF Power (W)30
Recommended RF Driver6000 Series Driver

(Values for Guidance Only - refer to datasheet where available)

  • Example AR Coating Curve (Guidance only)

    AR coating curve chart showing percent transmission (%T) plotted against wavelength from 485 to 625 nanometres. The single curve forms a steep U-shape, starting near 1.0% at the shortest wavelengths, dropping to a minimum close to 0.02% around 545 nanometres, and then rising again toward 1.0% by 625 nanometres, indicating optimum antireflection performance near 545 nm.