Optical Bonding
Our patented adhesive-free bonding process, Hy-Per Bond™, overcomes issues such as beam distortion and performance degradation resulting from the outgassing of optical cement.
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Products
Metrology
To deliver high quality components and systems, it is critical to accurately measure and test processed optical components with high precision and accuracy.
We have invested in world-class measurement equipment to ensure the parts our customers receive meet the most exacting of specifications.
We use a range of interferometric measurement systems during production and at the end of processes as part of our quality assurance procedures. This enables us to provide a broad range of exceptionally high-quality precision optical components and assemblies.
In addition to ongoing inspection results, we can provide further analytical support to clients through:
- Capability studies (to calculate Cpk)
- Failure Mode and Effects Analysis (FMEA)
- Production Part Approval Process (PPAP)
- Gauge R&R
- SPC techniques
| Metrology Instrument / System | Capabilities |
|---|---|
| 6” GPI™ LC interferometer | Visual fringe analysis of flat or spherical surfaces |
| Transmitted wavefront measurement, OD≤4 | |
| NewView™ 5000 white light interferometer | Fast, non-contact, high-precision 3D metrology of surface features |
| QED SSI stitching interferometer | Measures aspheric optics up to 1000 λ from best fit sphere |
| Measures components with NA up to 1 (full hemispheres) | |
| Measures plano, convex, or concave surfaces, OD≤200 mm | |
| Form Talysurf® PGI 1240 and 1250 | Measures dimension, form, and texture on curved surfaces |
| Nikon 6D Autocollimator | Prism angle measurement |
| Opticentric® | Centration measurement and alignment |
| Computer generated holograms (CGH) | 3D full aperture testing in conjunction with an interferometer |
| Can create virtually any wavefront shape | |
| Laser centration systems | Used for aberration-corrected lens assemblies |
| Enables mechanical re-balancing and pusher cell technology to optimize lens systems | |
| Coordinate measuring machines (CMM) | Used for aberration-corrected lens assemblies |
| Measures microscope objectives and complex lenses in 3D | |
| Bruker® Contour GT-K1 3D Optical Microscope | Measures surface roughness (Ra/Rq), step heights (diffractives) and other micro-features on optical surfaces |
| Zygo Verifire™ XPZ Interferometer | Measures spherical and flat surfaces featuring a high-resolution camera and digital electronics that can resolve more fringes |
| Zeiss Micura CMM equipped with VAST XT Gold Sensor | Supports scan speeds up to 200 points per second while allowing two measuring volumes, 500 x 500 x 500 millimeters and 500 x 700 x 500 millimeters |
| Zeiss Surfcom 3000A | Measures aspheres and equation driven freeforms on molded and diamond turned polymer optics |
| Mitutoyo Bright 504 CMM | Measures directly against 3D CAD model for more exotic freeform surfaces or off-axis aspheres |
| Asseses an optic's 3D location error | |
| OGP Flash 302 | Measures the size and location of mechanical features, including non-contact measurement of step heights |
| Wells Research OS210B Optical Test Bench | Reduces variation and allows a quick assessment of any astigmatism |
ZYGO® is a registered trademark of the Zygo Corporation
GPI™ and NewView™ are trademarks of the Zygo Corporation
Talysurf® is a registered trademark of Taylor Hobson
PrismMaster® and Opticentric® are registered trademarks of Trioptics
