AODF 4100-UV
For use at the wavelength of 364 nm, at an operating frequency of 75–125 MHz with a scan angle up to 29.5 mrad, and an active aperture of up to 4x14 mm.
Full Product Description- Wavelength:
- 364 nm
- Scan Angle:
- 29.5 mrad
- Operating Frequency:
- 75–125 MHz
- Active Aperture:
- 4x14 mm
Product description
Our range of deflectors utilizes our high-quality crystals and AR coatings, housed in a rugged and reliable package for unsurpassed consistency.
A variety of designs using optimized optical materials are available, with conduction cooling or water-cooling for high-power situations.
Our expert design staff can tailor deflector performance to meet your specific needs.
Key features
- Solid-state design
- Accurate position control
- Fast scan speeds
- Good temperature stability
- Repeatable performance
- Custom designs available
Specifications
| Name | Value |
|---|---|
| Wavelength | 364 nm |
| Scan Angle | 29.5 mrad |
| Operating Frequency | 75–125 MHz |
| Active Aperture | 4x14 mm |
| AO medium | TeO2 |
| Acoustic mode | Shear, on axis |
| Acoustic velocity | 0.617 mm/µs |
| Input polarization | Elliptical |
| Output polarization | Elliptical |
| Insertion loss | 10% |
| Center frequency (Fc) | 100 MHz |
| RF bandwidth | 50 MHz |
| RF power | <1.0 Watt |
| Diffraction efficiency | >75% |
| Flatness across bandwidth | 10% |
| Minimum diffraction efficiency | >70% |
| Peak valley at 633 nm | <0.125 |
| RMS at 633 nm | N/A |
| VSWR | <2.0:1 |
| Time bandwidth | N/A |
